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Logic built-in self-test : ウィキペディア英語版 | Logic built-in self-test Logic built-in self-test (or LBIST) is a form of built-in self-test (BIST) in which hardware and/or software is built into integrated circuits allowing them to test their own operation, as opposed to reliance on external automated test equipment. ==Advantages== The main advantage of LBIST is the ability to test internal circuits having no direct connections to external pins, and thus unreachable by external automated test equipment. Another advantage is the ability to trigger the LBIST of an integrated circuit while running a built-in self test or power-on self test of the finished product.
抄文引用元・出典: フリー百科事典『 ウィキペディア(Wikipedia)』 ■ウィキペディアで「Logic built-in self-test」の詳細全文を読む
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